Publications

You can also find my articles on my Google Scholar profile.

Book Chapter

B1. Dealing with Aging and Yield in Scaled Technologies

• Wei Ye, Mohamed Baker Alawieh, Che-Lun Hsu, Yibo Lin, and David Z. Pan
• In: Dependable Embedded Systems. Springer, 2019

Journal Articles

J1. Generative Learning in VLSI Design for Manufacturability: Current Status and Future Directions

• preprint
• Yibo Lin, Mohamed Baker Alawieh, Wei Ye, and David Z. Pan
• Journal of Microelectronic Manufacturing (JOMM), 2019 (Invited)

Conference Papers

C10. Re-examining VLSI Manufacturing and Yield through the Lens of Deep Learning

• preprint
• Mohamed Baker Alawieh, Wei Ye, and David Z. Pan
• IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2020.

C9. TEMPO: Fast Mask Topography Effect Modeling with Deep Learning

• preprint | Best Paper Award
• Wei Ye, Mohamed Baker Alawieh, Yuki Watanabe, Shigeki Nojima, Yibo Lin, and David Z. Pan
• ACM International Symposium on Physical Design (ISPD), Taipei, Taiwan, Mar 29-Apr 1, 2020.

C8. LithoGAN: End-to-End Lithography Modeling with Generative Adversarial Networks

• preprint | Best Paper Nomination
• Wei Ye, Mohamed Baker Alawieh, Yibo Lin, and David Z. Pan
• ACM/IEEE Design Automation Conference (DAC), Las Vegas, NV, Jun 2-6, 2019.

C7. Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection

• preprint
• Wei Ye, Mohamed Baker Alawieh, Meng Li, Yibo Lin, and David Z. Pan
• IEEE/ACM Proceedings Design, Automation and Test in Eurpoe (DATE), Florence, Italy, Mar 25-29, 2019.

C6. Tackling Signal Electromigration with Learning-Based Detection and Multistage Mitigation

• preprint
• Wei Ye, Mohamed Baker Alawieh, Yibo Lin, and David Z. Pan
• IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC), Tokyo, Japan, Jan 21-24, 2019.

C5. LithoROC: Lithography Hotspot Detection with Explicit ROC Optimization

• preprint | Invited Paper
• Wei Ye, Yibo Lin, Meng Li, Qiang Liu, and David Z. Pan
• IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC), Tokyo, Japan, Jan 21-24, 2019.

C4. Machine Learning for Yield Learning and Optimization

• preprint | Invited Paper
• Yibo Lin, Mohamed Baker Alawieh, Wei Ye, and David Z. Pan
• IEEE International Test Conference (ITC), Phoenix, Arizona, Oct, 2018.

C3. Power Grid Reduction by Sparse Convex Optimization

• preprint
• Wei Ye, Meng Li, Kai Zhong, Bei Yu, and David Z. Pan
• ACM International Symposium on Physical Design (ISPD), Monterey, California, Mar 25-28, 2018.

C2. Placement Mitigation Techniques for Power Grid Electromigration

• preprint
• Wei Ye, Yibo Lin, Xiaoqing Xu, Wuxi Li, Yiwei Fu, Yongsheng Sun, Canhui Zhan, and David Z. Pan
• IEEE International Symposium on Low Power Electronics and Design (ISLPED), Taipei, Jul 24-26, 2017.

C1. Standard Cell Layout Regularity and Pin Access Optimization Considering Middle-of-Line

• preprint
• Wei Ye, Bei Yu, Yong-Chan Ban, Lars Liebmann, and David Z. Pan
• ACM Great Lakes Symposium on VLSI (GLSVLSI), Pittsburgh, PA, USA, May 20-22, 2015.